التفاصيل البيبلوغرافية
| العنوان: |
Single-bit Laser Fault Model in NOR Flash Memories: Analysis and Exploitation |
| المؤلفون: |
Menu, Alexandre, Dutertre, Jean-Max, Rigaud, Jean-Baptiste, Colombier, Brice, Moellic, Pierre-Alain, Danger, Jean-Luc |
| المصدر: |
2020 Workshop on Fault Detection and Tolerance in Cryptography (FDTC) FDTC Fault Detection and Tolerance in Cryptography (FDTC), 2020 Workshop on. :41-48 Sep, 2020 |
| Relation: |
2020 Workshop on Fault Detection and Tolerance in Cryptography (FDTC) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
