التفاصيل البيبلوغرافية
| العنوان: |
Impact of Random Phase Distribution in 3D Vertical NAND Architecture of Ferroelectric Transistors on In-Memory Computing |
| المؤلفون: |
Choe, Gihun, Shim, Wonbo, Hur, Jae, Khan, Asif Islam, Yu, Shimeng |
| المصدر: |
2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2020 International Conference o. :165-168 Sep, 2020 |
| Relation: |
2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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