مؤتمر
Impact of Random Phase Distribution in 3D Vertical NAND Architecture of Ferroelectric Transistors on In-Memory Computing
العنوان: | Impact of Random Phase Distribution in 3D Vertical NAND Architecture of Ferroelectric Transistors on In-Memory Computing |
---|---|
المؤلفون: | Choe, Gihun, Shim, Wonbo, Hur, Jae, Khan, Asif Islam, Yu, Shimeng |
المصدر: | 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2020 International Conference o. :165-168 Sep, 2020 |
Relation: | 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) |
قاعدة البيانات: | IEEE Xplore Digital Library |
كن أول من يترك تعليقا!