التفاصيل البيبلوغرافية
العنوان: |
A Modeling Study on Performance of a CNOT Gate Devices based on Electrode-driven Si DQD Structures |
المؤلفون: |
Ryu, Hoon, Kang, Ji-Hoon |
المصدر: |
2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2020 International Conference o. :261-263 Sep, 2020 |
Relation: |
2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) |
قاعدة البيانات: |
IEEE Xplore Digital Library |