التفاصيل البيبلوغرافية
| العنوان: |
Complementary FET Device and Circuit Level Evaluation Using Fin-Based and Sheet-Based Configurations Targeting 3nm Node and Beyond |
| المؤلفون: |
Jiang, Liu, Pal, Ashish, Bazizi, El Mehdi, Saremi, Mehdi, Ren, He, Alexander, Blessy, Ayyagari-Sangamalli, Buvna |
| المصدر: |
2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2020 International Conference o. :323-326 Sep, 2020 |
| Relation: |
2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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