AC NEGF Simulation of Nanosheet MOSFETs

التفاصيل البيبلوغرافية
العنوان: AC NEGF Simulation of Nanosheet MOSFETs
المؤلفون: Hong, Sung-Min, Ahn, Phil-Hun
المصدر: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2020 International Conference o. :289-292 Sep, 2020
Relation: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9784863487635
تدمد:19461577
DOI:10.23919/SISPAD49475.2020.9241656