Influence of scribe lanes on wafer potentials and charging damage

التفاصيل البيبلوغرافية
العنوان: Influence of scribe lanes on wafer potentials and charging damage
المؤلفون: Lukaszek, W.
المصدر: 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432) Ion implantation technology Ion Implantation Technology, 2000. Conference on. :569-572 2000
Relation: 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780364627
9780780364622
DOI:10.1109/IIT.2000.924216