مؤتمر
HIL Simulation to Assess Interaction Risks of HVDC Systems for Upcoming Grid Development
العنوان: | HIL Simulation to Assess Interaction Risks of HVDC Systems for Upcoming Grid Development |
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المؤلفون: | Saad, H., Rault, P., Dennetiere, S., Schudel, M., Wikstrom, C., Sharifabadi, K. |
المصدر: | IECON 2020 The 46th Annual Conference of the IEEE Industrial Electronics Society Industrial Electronics Society (IECON), 2020 The 46th Annual Conference of the IEEE. :5041-5048 Oct, 2020 |
Relation: | IECON 2020 - 46th Annual Conference of the IEEE Industrial Electronics Society |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781728154145 9781728154138 |
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تدمد: | 25771647 |
DOI: | 10.1109/IECON43393.2020.9254807 |