التفاصيل البيبلوغرافية
| العنوان: |
Effects of X-ray Irradiation on Vertical GaN-on-GaN Schottky Barrier Diode Biased on the Applied Voltage |
| المؤلفون: |
Li, Xiao-Xi, Chen, Jin-Xin, Huang, Wei, Ji, Zhigang, Feng, Zhi-Hong, Wu, Su-Zhen, Xiao, Zhi-Qiang, Lu, Hong-Liang |
| المصدر: |
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2020 IEEE International Symposium on the. :1-4 Jul, 2020 |
| Relation: |
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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