دورية أكاديمية
Impact of Substrate Thickness on the Degradation in Multicrystalline Silicon
| العنوان: | Impact of Substrate Thickness on the Degradation in Multicrystalline Silicon |
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| المؤلفون: | Varshney, U., Kim, M., Khan, M.U., Hamer, P., Chan, C., Abbott, M., Hoex, B. |
| المصدر: | IEEE Journal of Photovoltaics IEEE J. Photovoltaics Photovoltaics, IEEE Journal of. 11(1):65-72 Jan, 2021 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 21563381 21563403 |
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| DOI: | 10.1109/JPHOTOV.2020.3038412 |