دورية أكاديمية
Phase Perturbation as a Measurement Metric: A Novel Noncontact In-Line Production Measurement Through an All-Electronic Millimeter-Wave System Tracking Millidegree Perturbations in Phase
| العنوان: | Phase Perturbation as a Measurement Metric: A Novel Noncontact In-Line Production Measurement Through an All-Electronic Millimeter-Wave System Tracking Millidegree Perturbations in Phase |
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| المؤلفون: | Day, A., Dwyer, M., van der Weide, D. |
| المصدر: | IEEE Microwave Magazine IEEE Microwave Microwave Magazine, IEEE. 22(1):79-85 Jan, 2021 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 15273342 15579581 |
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| DOI: | 10.1109/MMM.2020.3023270 |