مؤتمر
Single Event Transient Pulses Fault Injection Model based on LET for Circuit-Level Simulation
| العنوان: | Single Event Transient Pulses Fault Injection Model based on LET for Circuit-Level Simulation |
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| المؤلفون: | Xu, Chang-Qing, Liu, Yi, Weng, Xiao-Dong, Li, Zhi-Bing, Yang, Yin-Tang |
| المصدر: | 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) Solid-State & Integrated Circuit Technology (ICSICT, 2020 IEEE 15th International Conference on. :1-3 Nov, 2020 |
| Relation: | 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9781728162355 9781728162348 |
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| DOI: | 10.1109/ICSICT49897.2020.9278217 |