التفاصيل البيبلوغرافية
| العنوان: |
Feature Extraction of Micro-Crack Texture on Composite Insulator Shed by Edge Detection |
| المؤلفون: |
Ju, Yifeng, Yang, Yi, Chen, Junan, Wang, Ji, Wu, Yufeng, Gao, Yisong, Huang, Yibo, Hu, Shengda |
| المصدر: |
2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE) High Voltage Engineering and Application (ICHVE), 2020 IEEE International Conference on. :1-4 Sep, 2020 |
| Relation: |
2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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