Confirmation of the Instrumental Difference for Each Ion-Sensitive Field-Effect Transistors to Evaluate Mental Workload

التفاصيل البيبلوغرافية
العنوان:	Confirmation of the Instrumental Difference for Each Ion-Sensitive Field-Effect Transistors to Evaluate Mental Workload
المؤلفون:	KITAMURA, Kenichi, MURAI, Koji, WAKIDA, Shin-ichi
المصدر:	2020 IEEE International Conference on Systems, Man, and Cybernetics (SMC) Systems, Man, and Cybernetics (SMC), 2020 IEEE International Conference on. :1803-1808 Oct, 2020
Relation:	2020 IEEE International Conference on Systems, Man, and Cybernetics (SMC)
قاعدة البيانات:	IEEE Xplore Digital Library