مؤتمر
Test structure and method for capacitance extraction in multi-conductor systems
| العنوان: | Test structure and method for capacitance extraction in multi-conductor systems |
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| المؤلفون: | Ward, B., Bordelon, J., Prior, S., Tranchina, B., Jiann Liu |
| المصدر: | ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) Microelectronic test structures Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on. :189-193 2001 |
| Relation: | ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780365119 9780780365117 |
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| DOI: | 10.1109/ICMTS.2001.928660 |