Extreme Sparse X-ray Computed Laminography Via Convolutional Neural Networks

التفاصيل البيبلوغرافية
العنوان:	Extreme Sparse X-ray Computed Laminography Via Convolutional Neural Networks
المؤلفون:	Pereira, Luis F. Alves, de Beenhouwer, Jan, Kastner, Johann, Sijbers, Jan
المصدر:	2020 IEEE 32nd International Conference on Tools with Artificial Intelligence (ICTAI) ICTAI Tools with Artificial Intelligence (ICTAI), 2020 IEEE 32nd International Conference on. :612-616 Nov, 2020
Relation:	2020 IEEE 32nd International Conference on Tools with Artificial Intelligence (ICTAI)
قاعدة البيانات:	IEEE Xplore Digital Library