Novel RTA technique for large diameter GaAs wafers managing to minimize both dopant diffusion and slip formation

التفاصيل البيبلوغرافية
العنوان: Novel RTA technique for large diameter GaAs wafers managing to minimize both dopant diffusion and slip formation
المؤلفون: Sakurada, T., Kiyama, M., Nakajima, S., Tatsumi, M.
المصدر: Conference Proceedings. 2001 International Conference on Indium Phosphide and Related Materials. 13th IPRM (Cat. No.01CH37198) Indium phosphide and related materials Indium Phosphide and Related Materials, 2001. IPRM. IEEE International Conference On. :425-427 2001
Relation: Conference Proceedings. 2001 International Conference on Indium Phosphide and Related Materials. 13th IPRM
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780367006
9780780367005
تدمد:10928669
DOI:10.1109/ICIPRM.2001.929149