دورية أكاديمية
Does the Threshold Voltage Extraction Method Affect Device Variability?
| العنوان: | Does the Threshold Voltage Extraction Method Affect Device Variability? |
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| المؤلفون: | Espineira, G., Garcia-Loureiro, A.J., Seoane, N. |
| المصدر: | IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 9:469-475 2021 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 21686734 |
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| DOI: | 10.1109/JEDS.2020.3046122 |