مؤتمر
Testing of Configurable 8T SRAMs for In-Memory Computing
| العنوان: | Testing of Configurable 8T SRAMs for In-Memory Computing |
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| المؤلفون: | Li, Jin-Fu, Tsai, Tsai-Ling, Hsu, Chun-Lung, Sun, Chi-Tien |
| المصدر: | 2020 IEEE 29th Asian Test Symposium (ATS) Asian Test Symposium (ATS), 2020 IEEE 29th. :1-5 Nov, 2020 |
| Relation: | 2020 IEEE 29th Asian Test Symposium (ATS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781728174679 |
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| تدمد: | 23775386 |
| DOI: | 10.1109/ATS49688.2020.9301535 |