Single Event Transient (SET) Mitigation Circuits With Immune Leaf Nodes

التفاصيل البيبلوغرافية
العنوان:	Single Event Transient (SET) Mitigation Circuits With Immune Leaf Nodes
المؤلفون:	Sajjade, F.M., Goyal, N.K., Varaprasad, B.K.S.V.L.
المصدر:	IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 21(1):70-78 Mar, 2021
قاعدة البيانات:	IEEE Xplore Digital Library

الوصف
تدمد:	15304388 15582574
DOI:	10.1109/TDMR.2021.3051846