مؤتمر
A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices
| العنوان: | A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices |
|---|---|
| المؤلفون: | Chuang, Chien-Hui, Hou, Kuan-Wei, Wu, Cheng-Wen, Lee, Mincent, Tsai, Chia-Heng, Chen, Hao, Wang, Min-Jer |
| المصدر: | 2020 IEEE International Test Conference (ITC) Test Conference (ITC), 2020 IEEE International. :1-9 Nov, 2020 |
| Relation: | 2020 IEEE International Test Conference (ITC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781728191133 |
|---|---|
| تدمد: | 23782250 |
| DOI: | 10.1109/ITC44778.2020.9325221 |