مؤتمر
Die-to-Die Testing and ECC Error Mitigation in Automotive and Industrial Safety Applications
| العنوان: | Die-to-Die Testing and ECC Error Mitigation in Automotive and Industrial Safety Applications |
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| المؤلفون: | Boschi, Gabriele, Spano, Elisa, Grigoryan, Hayk, Kumar, Arun, Harutyunyan, Gurgen |
| المصدر: | 2020 IEEE International Test Conference (ITC) Test Conference (ITC), 2020 IEEE International. :1-6 Nov, 2020 |
| Relation: | 2020 IEEE International Test Conference (ITC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781728191133 |
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| تدمد: | 23782250 |
| DOI: | 10.1109/ITC44778.2020.9325242 |