دورية أكاديمية
BTI and Soft-Error Tolerant Voltage Bootstrapped Schmitt Trigger Circuit
| العنوان: | BTI and Soft-Error Tolerant Voltage Bootstrapped Schmitt Trigger Circuit |
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| المؤلفون: | Gupta, N., Shah, A.P., Vishvakarma, S.K. |
| المصدر: | IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 21(1):153-155 Mar, 2021 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 15304388 15582574 |
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| DOI: | 10.1109/TDMR.2021.3052141 |