The test process date based quality defect detection strategy for spacecraft components

التفاصيل البيبلوغرافية
العنوان: The test process date based quality defect detection strategy for spacecraft components
المؤلفون: Qin, Taichun, Liu, Shouwen, Huang, Shouqing, Zhou, Yuege
المصدر: 2020 7th International Conference on Dependable Systems and Their Applications (DSA) DSA Dependable Systems and Their Applications (DSA), 2020 7th International Conference on. :550-554 Nov, 2020
Relation: 2020 7th International Conference on Dependable Systems and Their Applications (DSA)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9780738124223
DOI:10.1109/DSA51864.2020.00093