مؤتمر
Exploiting Inconsistency Problem in Multi-label Classification via Metric Learning
| العنوان: | Exploiting Inconsistency Problem in Multi-label Classification via Metric Learning |
|---|---|
| المؤلفون: | Li, Peiyan, Qin, Zhili, Wang, Honglian, Yang, Qinli, Shao, Junming |
| المصدر: | 2020 IEEE International Conference on Data Mining (ICDM) ICDM Data Mining (ICDM), 2020 IEEE International Conference on. :1100-1105 Nov, 2020 |
| Relation: | 2020 IEEE International Conference on Data Mining (ICDM) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781728183169 |
|---|---|
| تدمد: | 23748486 |
| DOI: | 10.1109/ICDM50108.2020.00132 |