مؤتمر
Exploiting Inconsistency Problem in Multi-label Classification via Metric Learning
العنوان: | Exploiting Inconsistency Problem in Multi-label Classification via Metric Learning |
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المؤلفون: | Li, Peiyan, Qin, Zhili, Wang, Honglian, Yang, Qinli, Shao, Junming |
المصدر: | 2020 IEEE International Conference on Data Mining (ICDM) ICDM Data Mining (ICDM), 2020 IEEE International Conference on. :1100-1105 Nov, 2020 |
Relation: | 2020 IEEE International Conference on Data Mining (ICDM) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781728183169 |
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تدمد: | 23748486 |
DOI: | 10.1109/ICDM50108.2020.00132 |