دورية أكاديمية
Evidence of Interface Trap Build-Up in Irradiated 14-nm Bulk FinFET Technologies
| العنوان: | Evidence of Interface Trap Build-Up in Irradiated 14-nm Bulk FinFET Technologies |
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| المؤلفون: | Privat, A., Barnaby, H.J., Spear, M., Esposito, M., Manuel, J.E., Clark, L., Brunhaver, J., Duvnjak, A., Jokai, R., Holbert, K.E., McLain, M.L., Marinella, M.J., King, M.P. |
| المصدر: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 68(5):671-676 May, 2021 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189499 15581578 |
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| DOI: | 10.1109/TNS.2021.3065267 |