Wafer-Scale Encapsulated Saw Temperature and Pressure Sensors for Harsh Environments

التفاصيل البيبلوغرافية
العنوان: Wafer-Scale Encapsulated Saw Temperature and Pressure Sensors for Harsh Environments
المؤلفون: Ng, Eldwin J., Sharma, Jaibir, Ching, Eva Wai Leong, Wu, Guoqiang, Pohl, Didier, Vancauwenberghe, Olivier
المصدر: 2021 IEEE 34th International Conference on Micro Electro Mechanical Systems (MEMS) Micro Electro Mechanical Systems (MEMS), 2021 IEEE 34th International Conference on. :370-373 Jan, 2021
Relation: 2021 IEEE 34th International Conference on Micro Electro Mechanical Systems (MEMS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665419123
تدمد:21601968
DOI:10.1109/MEMS51782.2021.9375369