مؤتمر
Fully Single Event Double Node Upset Tolerant Design for Magnetic Random Access Memory
العنوان: | Fully Single Event Double Node Upset Tolerant Design for Magnetic Random Access Memory |
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المؤلفون: | Zhang, Deming, Wang, Xian, Zhang, Kaili, Zeng, Lang, Wang, You, Wang, Bi, Deng, Erya, Wang, Chuanjie, Wu, Peng, Zhang, Youguang, Zhao, Weisheng |
المصدر: | 2021 IEEE International Symposium on Circuits and Systems (ISCAS). :1-5 May, 2021 |
Relation: | 2021 IEEE International Symposium on Circuits and Systems (ISCAS) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781728192017 |
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تدمد: | 21581525 |
DOI: | 10.1109/ISCAS51556.2021.9401294 |