Fully Single Event Double Node Upset Tolerant Design for Magnetic Random Access Memory

التفاصيل البيبلوغرافية
العنوان: Fully Single Event Double Node Upset Tolerant Design for Magnetic Random Access Memory
المؤلفون: Zhang, Deming, Wang, Xian, Zhang, Kaili, Zeng, Lang, Wang, You, Wang, Bi, Deng, Erya, Wang, Chuanjie, Wu, Peng, Zhang, Youguang, Zhao, Weisheng
المصدر: 2021 IEEE International Symposium on Circuits and Systems (ISCAS). :1-5 May, 2021
Relation: 2021 IEEE International Symposium on Circuits and Systems (ISCAS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781728192017
تدمد:21581525
DOI:10.1109/ISCAS51556.2021.9401294