التفاصيل البيبلوغرافية
العنوان: |
The Characterization of Degradation on various SiON pMOSFET transistors under AC/DC NBTI stress |
المؤلفون: |
Kim, Gang-Jun, Yoon, Moonjee, Kim, SungHwan, Eo, Myeongkyu, Kim, Shinhyung, You, Taehun, Lee, Namhyun, Kim, Kijin, Pae, Sangwoo |
المصدر: |
2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-4 Mar, 2021 |
Relation: |
2021 IEEE International Reliability Physics Symposium (IRPS) |
قاعدة البيانات: |
IEEE Xplore Digital Library |