مؤتمر
Advancing Static Performance and Ruggedness of 600 V SiC MOSFETs: Experimental Analysis and Simulation Study
| العنوان: | Advancing Static Performance and Ruggedness of 600 V SiC MOSFETs: Experimental Analysis and Simulation Study |
|---|---|
| المؤلفون: | Kim, Dongyoung, Yun, Nick, Sung, Woongje |
| المصدر: | 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-4 Mar, 2021 |
| Relation: | 2021 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781728168937 |
|---|---|
| تدمد: | 19381891 |
| DOI: | 10.1109/IRPS46558.2021.9405109 |