التفاصيل البيبلوغرافية
| العنوان: |
Multilevel Programming Reliability in Si-doped GeSbTe for Storage Class Memory |
| المؤلفون: |
Lama, G., Bernard, M., Bernier, N., Bourgeois, G., Nolot, E., Castellani, N., Garrione, J., Cyrille, M. C., Navarro, G., Nowak, E. |
| المصدر: |
2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-6 Mar, 2021 |
| Relation: |
2021 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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