التفاصيل البيبلوغرافية
العنوان: |
Multilevel Programming Reliability in Si-doped GeSbTe for Storage Class Memory |
المؤلفون: |
Lama, G., Bernard, M., Bernier, N., Bourgeois, G., Nolot, E., Castellani, N., Garrione, J., Cyrille, M. C., Navarro, G., Nowak, E. |
المصدر: |
2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-6 Mar, 2021 |
Relation: |
2021 IEEE International Reliability Physics Symposium (IRPS) |
قاعدة البيانات: |
IEEE Xplore Digital Library |