مؤتمر
Unique measurement to monitor the gate oxide lifetime indicator, case studies
| العنوان: | Unique measurement to monitor the gate oxide lifetime indicator, case studies |
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| المؤلفون: | Gagnard, X., Bonnaud, O. |
| المصدر: | Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2001. IPFA 2001. Proceedings of the 2001 8th International Symposium on the. :156-160 2001 |
| Relation: | Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780366751 9780780366756 |
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| DOI: | 10.1109/IPFA.2001.941476 |