دورية أكاديمية
CMOS Pixel Potentials Extraction Method From Test Structures Based on EKV Model
| العنوان: | CMOS Pixel Potentials Extraction Method From Test Structures Based on EKV Model |
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| المؤلفون: | Doyen, C., Ricq, S., Fonteneau, P., Marcelot, O., Magnan, P. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(6):2835-2840 Jun, 2021 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2021.3075178 |