Domain structure and residual-strain characterization of epitaxial Pb(Zr/sub x/Ti/sub 1-x/)O/sub 3/ thin films

التفاصيل البيبلوغرافية
العنوان: Domain structure and residual-strain characterization of epitaxial Pb(Zr/sub x/Ti/sub 1-x/)O/sub 3/ thin films
المؤلفون: Saito, K., Yamaji, I., Akai, T., Aratani, N., Nagashima, K., Funakubo, H.
المصدر: ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics (IEEE Cat. No.00CH37076) Applications of ferroelectrics Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on. 2:913-916 vol. 2 2000
Relation: ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780359402
9780780359406
تدمد:10994734
DOI:10.1109/ISAF.2000.942466