مؤتمر
Residual stresses in the electrode of Pt/Ti for the thermal detector with thin-film structure
| العنوان: | Residual stresses in the electrode of Pt/Ti for the thermal detector with thin-film structure |
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| المؤلفون: | Kibeom Kim, Mina Yoo, Sangil Lee, Dohoon Kim, Seongho Bae, Moonho Lee |
| المصدر: | ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics (IEEE Cat. No.00CH37076) Applications of ferroelectrics Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on. 2:929-932 vol. 2 2000 |
| Relation: | ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780359402 9780780359406 |
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| تدمد: | 10994734 |
| DOI: | 10.1109/ISAF.2000.942470 |