Built-In Self-Test Circuits for High-Speed JESD204B Transceiver Controller

التفاصيل البيبلوغرافية
العنوان: Built-In Self-Test Circuits for High-Speed JESD204B Transceiver Controller
المؤلفون: Yin, Peng, Zeng, Xiaoping, Tang, Fang
المصدر: 2021 12th International Symposium on Advanced Topics in Electrical Engineering (ATEE) Advanced Topics in Electrical Engineering (ATEE), 2021 12th International Symposium on. :1-5 Mar, 2021
Relation: 2021 12th International Symposium on Advanced Topics in Electrical Engineering (ATEE)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665418782
9781665418775
تدمد:21593604
DOI:10.1109/ATEE52255.2021.9425113