Introduction to Analog Testing of Resistive Random Access Memory (RRAM) Devices Towards Scalable Analog Compute Technology for Deep Learning

التفاصيل البيبلوغرافية
العنوان:	Introduction to Analog Testing of Resistive Random Access Memory (RRAM) Devices Towards Scalable Analog Compute Technology for Deep Learning
المؤلفون:	Pujari, Ruturaj, Gasasira, Arthur, Kim, Youngseok, Katragadda, Veenadhar, Seo, Soon-Cheon, Kong, Dexin, Liu, Xuefeng, Teehan, Sean, Saulnier, Nicole, Ahsan, Ishtiaq, Narayanan, Vijay, Ando, Takashi
المصدر:	2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) Advanced Semiconductor Manufacturing Conference (ASMC), 2021 32nd Annual SEMI. :1-4 May, 2021
Relation:	2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
قاعدة البيانات:	IEEE Xplore Digital Library