التفاصيل البيبلوغرافية
العنوان: |
Introduction to Analog Testing of Resistive Random Access Memory (RRAM) Devices Towards Scalable Analog Compute Technology for Deep Learning |
المؤلفون: |
Pujari, Ruturaj, Gasasira, Arthur, Kim, Youngseok, Katragadda, Veenadhar, Seo, Soon-Cheon, Kong, Dexin, Liu, Xuefeng, Teehan, Sean, Saulnier, Nicole, Ahsan, Ishtiaq, Narayanan, Vijay, Ando, Takashi |
المصدر: |
2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) Advanced Semiconductor Manufacturing Conference (ASMC), 2021 32nd Annual SEMI. :1-4 May, 2021 |
Relation: |
2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) |
قاعدة البيانات: |
IEEE Xplore Digital Library |