Characterization of an Asymmetrical Capacitive MEMS Tilt Sensor

التفاصيل البيبلوغرافية
العنوان: Characterization of an Asymmetrical Capacitive MEMS Tilt Sensor
المؤلفون: Gao, Y., Zhang, X., Qi, Y., Zhang, H., Ryutaro, M., Jiang, Z., Wei, X.
المصدر: 2021 IEEE 16th International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) Nano/Micro Engineered and Molecular Systems (NEMS), 2021 IEEE 16th International Conference on. :1660-1663 Apr, 2021
Relation: 2021 IEEE 16th International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665419413
تدمد:24743755
DOI:10.1109/NEMS51815.2021.9451287