التفاصيل البيبلوغرافية
| العنوان: |
Machine-Learning based TCAD Optimization Method for Next Generation BCD Process Development |
| المؤلفون: |
Yoo, Jaehyun, Jeon, Yongwoo, Jung, Dawon, Kim, Junhyuk, Ryu, Jisu, Kwon, UiHui, Kim, Dae Sin, Kim, Kwangtae, Kim, Yongdon, Lee, Kyuok, Jung, Jeahyun, kwon, Ohkyum |
| المصدر: |
2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2021 33rd International Symposium on. :279-282 May, 2021 |
| Relation: |
2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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