مؤتمر
Biasing Techniques: Validation of 3 to 8 Decoder Modules Using 18nm FinFET Nodes
| العنوان: | Biasing Techniques: Validation of 3 to 8 Decoder Modules Using 18nm FinFET Nodes |
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| المؤلفون: | Pittala, Chandra Shaker, Lavanya, M., Saritha, M., Vijay, V., Venkateswarlu, S. China, Vallabhuni, Rajeev Ratna |
| المصدر: | 2021 2nd International Conference for Emerging Technology (INCET) Emerging Technology (INCET),2021 2nd International Conference for. :1-4 May, 2021 |
| Relation: | 2021 2nd International Conference for Emerging Technology (INCET) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9781728170275 9781728170299 9781728170282 |
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| DOI: | 10.1109/INCET51464.2021.9456319 |