Methods for Fast Characterization of Noise and Offset in Dynamic Comparators

التفاصيل البيبلوغرافية
العنوان: Methods for Fast Characterization of Noise and Offset in Dynamic Comparators
المؤلفون: Silva, Joao, Brito, Diogo, Rodrigues, Goncalo, Rabuske, Taimur, Pinto, Antonio Couto, Fernandes, Jorge
المصدر: 2021 19th IEEE International New Circuits and Systems Conference (NEWCAS) New Circuits and Systems Conference (NEWCAS), 2021 19th IEEE International. :1-4 Jun, 2021
Relation: 2021 19th IEEE International New Circuits and Systems Conference (NEWCAS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665424295
DOI:10.1109/NEWCAS50681.2021.9462744