دورية أكاديمية
X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan
| العنوان: | X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan |
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| المؤلفون: | Liu, Y., Milewski, S., Mrugalski, G., Mukherjee, N., Rajski, J., Tyszer, J., Wlodarczak, B. |
| المصدر: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 29(8):1553-1566 Aug, 2021 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 10638210 15579999 |
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| DOI: | 10.1109/TVLSI.2021.3092421 |