التفاصيل البيبلوغرافية
العنوان: |
Development status of gate-first FeFET technology |
المؤلفون: |
Muller, S., Zhou, H., Benoist, A., Ocker, J., Noack, M., Kuzmanov, G., Iqbal, R., Le Minh, D., Ghazaryan, M., Anjaneyamoorthi, V., Daraghmah, A., Mennenga, M., Koushan, F., Tassan, F., Dunkel, S., Muller, J., Beyer, S., Soss, S., Pourkeramati, A. |
المصدر: |
2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021 |
Relation: |
2021 Symposium on VLSI Technology |
قاعدة البيانات: |
IEEE Xplore Digital Library |