دورية أكاديمية
Impact of Vth Instability on Time-Resolved Characteristics of MIS-HEMT-Based GaN Power IC
| العنوان: | Impact of Vth Instability on Time-Resolved Characteristics of MIS-HEMT-Based GaN Power IC |
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| المؤلفون: | Bi, L., Jiang, Q., Huang, S., Wang, X., Wang, Y., Li, Y., Guo, F., Luan, T., Liu, Y., Fan, J., Yin, H., Wei, K., Zheng, Y., Liu, X. |
| المصدر: | IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 42(10):1440-1443 Oct, 2021 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 07413106 15580563 |
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| DOI: | 10.1109/LED.2021.3106785 |