Development of a Single, Scalable Testing Platform for Read-In Integrated Circuit LED Wafers

التفاصيل البيبلوغرافية
العنوان: Development of a Single, Scalable Testing Platform for Read-In Integrated Circuit LED Wafers
المؤلفون: Singh, Jaclyn, Kiamilev, Fouad E., Hernandez, Miguel, Landwehr, Aaron, Browning, Tyler
المصدر: 2021 IEEE Research and Applications of Photonics in Defense Conference (RAPID) Photonics in Defense Conference (RAPID), 2021 IEEE Research and Applications of. :1-2 Aug, 2021
Relation: 2021 IEEE Research and Applications of Photonics in Defense Conference (RAPID)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665422239
DOI:10.1109/RAPID51799.2021.9521409