دورية أكاديمية
Investigating 3D NAND Flash Read Disturb Reliability With Extreme Value Analysis
| العنوان: | Investigating 3D NAND Flash Read Disturb Reliability With Extreme Value Analysis |
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| المؤلفون: | Zambelli, C., Crippa, L., Micheloni, R., Olivo, P. |
| المصدر: | IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 21(4):486-493 Dec, 2021 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 15304388 15582574 |
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| DOI: | 10.1109/TDMR.2021.3108941 |