Exploring W-Cu hybrid dual damascene metallization for future nodes

التفاصيل البيبلوغرافية
العنوان: Exploring W-Cu hybrid dual damascene metallization for future nodes
المؤلفون: van der Veen, Marleen H., Pedreira, O. Varela, Heylen, N., Jourdan, N., Lariviere, S., Park, S., Struyf, H., Tokei, Zs., Lei, W., Pethe, S., Hwang, S., Chen, F., Wu, Z., Machillot, J., Cockburn, A., Jansen, A.
المصدر: 2021 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2021 IEEE International. :1-3 Jul, 2021
Relation: 2021 IEEE International Interconnect Technology Conference (IITC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781728176321
تدمد:23806338
DOI:10.1109/IITC51362.2021.9537410