مؤتمر
The electrical characteristics of oxide due to processing condition
العنوان: | The electrical characteristics of oxide due to processing condition |
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المؤلفون: | Nung-Pyo Hong, Doo-Jin Choi, Tae-Sun Lee, Byung-Ha Choi, Tae-Hoon Kim, Jin-Woong Hong |
المصدر: | ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Solid dielectrics Solid Dielectrics, 2001. ICSD '01. Proceedings of the 2001 IEEE 7th International Conference on. :211-214 2001 |
Relation: | ICSD'01. Proceedings of the 2001 IEEE 7th International Conference on Solid Dielectrics |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0780363523 9780780363526 |
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DOI: | 10.1109/ICSD.2001.955595 |