مؤتمر
Automated Full-Board SI Scan for High-Speed Applications up to 112Gb/s and Beyond
| العنوان: | Automated Full-Board SI Scan for High-Speed Applications up to 112Gb/s and Beyond |
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| المؤلفون: | Cai, Kevin, Gao, Anna, Sen, Bidyut, Wan, Joshua, Ling, Feng |
| المصدر: | 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium EMC/SI/PI and EMC Europe Symposium, 2021 IEEE International Joint. :429-429 Jul, 2021 |
| Relation: | 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9781665448888 |
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| DOI: | 10.1109/EMC/SI/PI/EMCEurope52599.2021.9559244 |