التفاصيل البيبلوغرافية
| العنوان: |
Industrial best practice: cases of study by automotive chip- makers |
| المؤلفون: |
Abbati, L. Degli, Ullmann, R., Paganini, G., Coppetta, M., Zaia, L., Huard, V., Montfort, O., Cantoro, R., Insinga, G., Venini, F., Calao, P., Bernardi, P. |
| المصدر: |
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2021 IEEE International Symposium on. :1-6 Oct, 2021 |
| Relation: |
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
